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AIM-6000

  • TOTAL MEASURING EQUIPMENT SYSTEM
    For OLED, LCD, ITO Film, Thin Film Solar-cell

Specification

SE+SR Auto scanning module

  • SE+SR Auto scanning module
  • Spectral Range : 350 ~ 1000
  • Acquisition speed : 1~5 sec/point
  • Metrology Performance
  • § Film thickness
  • § Refractive index(n) and extincion coefficient(k)
  • § Uniformity

3D Microscope

  • Magnification : 108X ~ 17,280X
  • Light Source : 405nm Laser
  • Repeatability
  • X,Y - 0.12nm
  • Z - 10nm
  • Step height measurement(3D)
  • Roughness measurement

Sheet Resistance Meter

  • Sheet Resistance meter
  • Auto & Manual Mode
  • Report (Excel)
  • Repeatability : ± 0.3% of reading
  • Uniformity

Option

VIS/NIR Spectrophotometer

  • W.L. range : 350nm ~ 1100nm(option : 900nm ~ 1600nm)
  • W.L. Resolution : 5nm
  • Transmission & Reflection

XRF(Solar Cell Analysis System

  • Multi Layer thickness & Content Analysis with SEM
본사주소 : 충남 아산시 둔포면 아산밸리로 387번길 62
공장주소 : 충남 아산시 둔포면 아산밸리로 387번길 62
Tel : 041-547-0135 | FAX. 041-547-0139

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